Automated Test Pattern Generation for Quantum Circuits
نویسندگان
چکیده
منابع مشابه
Automated Test Pattern Generation for Quantum Circuits
This work extends a general method used to test classical circuits to quantum circuits. Gate internal errors are address using a discrete fault model. Fault models to represent unwanted nearest neighbor entanglement as well as unwanted qubit rotation are presented. When witnessed, the faults we model are probabilistic, but there is a set of tests with the highest probability of detecting a disc...
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ژورنال
عنوان ژورنال: McNair Scholars Online Journal
سال: 2005
ISSN: 2375-7833
DOI: 10.15760/mcnair.2005.38